About
News and Events
Research and Programs
Carbon Management Point Source Carbon Capture Carbon Dioxide Removal Carbon Dioxide Conversion Carbon Transport & Storage Hydrogen with Carbon Management
Resource Sustainability Methane Mitigation Technologies Minerals Sustainability Natural Gas Decarbonization and Hydrogen Technologies Advanced Remediation Technologies Energy Asset Transformation
Key Lab Initiatives Advanced Alloys Signature Center (AASC) Science-based Artificial Intelligence and Machine Learning Institute (SAMI) Center for Microwave Chemistry (CMC) Center for Fuels and Chemicals (CFC)
Business
Library
Explore our Library

Approved Categorical Exclusions Environmental Assessments Environmental Impact Statements Oil and Gas Projects Summaries NETL Fact Sheets NETL Newsletters Publication Search Energy Data Exchange (EDX) FECM External R&D Final Technical Reports Project Landing Page Summary Information for External R&D Awards NETL R&D Publication Search Peer Review Reports
- Research and Programs
- Carbon Management
- Core Competencies
- Resource Sustainability
- University Training & Research
- Key Lab Initiatives
- Energy Technology Development
- Featured Infrastructure
-
- Business
- Technology Transfer
-
- Library
- Energy Analysis
-
- About
- News and Events
- Education



Researchers at NETL and UIUC used a novel method to fabricate amorphous 2-D carbon film using coal-derived carbon quantum dots. This carbon film with continuous random network region can act as an excellent dielectric material. One of the applications that takes advantage of this amorphous 2-D carbon film is RRAM. Due to the atomically thin structure of the carbon film, the RRAM device made with this invention requires extremely low operating voltage (low energy consumption). Furthermore, the memristor fabricated with this amorphous carbon film provides pre-defined, stabilized, areas for the filament formation. This helps the RRAM device to display minimal variability and achieve improved endurance as well as longer memory retention. Integrating the amorphous carbon film into RRAM enables low-voltage operation, reduces or eliminates device-to-device (spatial) and cycle-to-cycle (temporal) variability and provides improved endurance, and long-term data retention.