Project No: FC26-99FT40685
Performer: Center for Photonics Technology
Robert Romanosky Crosscutting Research Technology Manager National Energy Technology Laboratory 3610 Collins Ferry Road P.O. Box 880 Morgantown, WV 26507-0880 304-285-4721 Robert.Romanosky@netl.doe.gov
Jenny Tennant Gasification Systems Technology Manager National Energy Technology Laboratory 3610 Collins Ferry Road P.O. Box 880 Morgantown, WV 26507-0880 304-285-4830 Jenny.Tennant@netl.doe.gov
Susan Maley Project Manager National Energy Technology Laboratory 3610 Collins Ferry Road P.O. Box 880 Morgantown, WV 26507-0880 304-285-1321 Susan.Maley@netl.doe.gov
Anbo Wang Principal Investigator Virginia Polytechnic Institute and State University Center for Photonics Technology 460 Turner Street Suite 303 Blacksburg, Virginia 24061 540-231-4355 email@example.com
DOE Share: $3,227,786.00
Performer Share: $847,596.00
Total Award Value: $4,075,382.00
Performer website: Center for Photonics Technology - http://photonics.ece.vt.edu/
This system utilizes a sapphire-based fiber and a sapphire wafer to form a point sensor (Figure 1) that is referred to as an extrinsic Fabry-Perot interferometric (EFPI) sensor. The EFPI sensor records temperature data from inside the gasifier at temperatures up to 1,600 °C. The project approach is based on the optical path difference (OPD) between reflections from the two surfaces of a sapphire wafer. The two reflections will interfere with each other, producing a modulated spectrum, the pattern of which is determined by the optical thickness (OT) of the wafer. The OT is the product of the refractive index and the thickness of the wafer, both of which have thermal dependence, resulting in a temperature-sensitive OT and spectrum. Therefore, the temperature can be determined from the change in the reflected spectrum.
Single-crystal sapphire sensor heads with sapphire fiber waveguides achieve greater precision through miniaturization.
Program Background and Project Benefits
This effort succeeded in developing and testing a prototype temperature measurement system under full-scale operating conditions thus creating a important opportunity for process improvement, cost reduction, and greater efficiency. Specific accomplishments include: