February 14-15, 2001
Table of Contents
This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government or any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.
Technical Discussions/Topical Areas:
Cell/Stack Materials and Manufacturing Processes
Current status/issues/prioritization; electrode chemical and structural stability, interface stability, interface modification, low-temperature, operation, process optimization, current collector materials, seals, insulation, redox anode, iR and polarization minimization.
Stack/System Performance and Modeling
Current status/issues/prioritization; electrical, thermal, chemical model, normal and transient operation, internal/direct oxidation model, cell/stack/system model.
Overall Prioritization/Final Adjustments
Gary McVay, Leader; Participants